Yi-Xin Technology and ThetaMetrisis has signed an agreement for the distribution of ThetaMetrisis products in the market of China.

Prospective customers from China are kindly requested to contact Mr. Simon Hao for further information on ThetaMetrisis products and live demonstration of their capabilities.

Simon Hao --- Sales Director Yixin Technology --- Professional Supplier for Micro-Nano Science SH office:

上海市沪青平公路2008号(靠明珠路)竞衡大业广场803室 Mobile: +86 13636694894

Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Website: www.micro-nanotech.com

The EU-funded FOODSNIFFER project was successfully end.

For more information on the project outcome please read the final publishable summary

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The version 3.3 of FR-Monitor software was released on October 29th, 2015

FR-Monitor, is our user-friendly software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.3. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • Improved GUI fro easier operation
  • Calculation in units other than nanometers.
  • Updated colour analysis method
  • Extended Materials Database both in terms of materials and optical properties models
FR-Monitor v3.2 Release

 

FR-Monitor v3.3 is available for download for both 32- and 64-bit operating systems to all our customers.

FR-Monitor run in all computers with Windows XP, 7, 8, 10

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

The version 3.2 of FR-Monitor software was released on September 1st, 2015

FR-Monitor, is our user-friendly software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.2. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • Option of linked layers per category in case of multilayers of repeating films.
  • Updated colour analysis method
  • Extended Materials Database both in terms of materials and optical properties models
FR-Monitor v3.2 Release

 

FR-Monitor v3.2 is available for download for both 32- and 64-bit operating systems to all our customers.

FR-Monitor run in all computers with Windows XP, 7, 8, 10

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

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The version 3.1 of FR-Monitor software was released on January 2nd, 2015

FR-Monitor, is our software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.1. In this version, certain new features and improvements were added, a small fraction of which are:

 

  • Calibration with spectralon
  • Updated GUI
  • Updated Referencing method
  • Extended Materials Database both in terms of materials and optical properties models
  • Updated Color coding
FR-Monitor v2.0 Release

 

FR-Monitor v3.1 is available for download for both 32- and 64-bit operating systems to all our customers.

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

FR-Scanner, the compact bench-top tool suitable for the automatic characterization of films and coatings on large substrates.

With FR-Scanner the user performs accurate reflectance measurements in any regime within the 350-1100nm spectral range. FR-Scanner is the ideal tool for the fast and accurate mapping of films in terms of thickness, refractive index, uniformity, color etc. Wafers of any diameter (2inch-300mm) can be accommodated on the vacuum chuck. Thanks to its robust & unique optical and mechanical design, FR-Scanner scan the samples under test by rotating the stage and by moving linearly the optical head on top (polar scanning). Simulated X-Y scanning is also available. This way accurate reflectance data with high repeatability are recorded in a very short time making FR-Scanner the ideal tool for the at-line and on-line characterization of wafers or other substrates (e.g. PV panels) at processing facilities.

Typical scanning of an 8” Si wafer at 600 points take no more that 3min.
FR-Scanner tool

 

FR-Monitor Wafer Mapping

 

For more information please contact our sales team at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

The version 2.5 of FR-Monitor software was released on January 2nd, 2014

FR-Monitor, is our software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v2.5. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • The TRUST fitting algorithm was added
  • The Lorenz model for the calculation of refractive index of thin and thick layers
  • Updated Referencing method
  • Extended Materials Database both in terms of materials and optical properties models
  • New Color coding for the various graphs
FR-Monitor v2.0 Release

 

FR-Monitor v2.5 is available for download for both 32- and 64-bit operating systems to all our customers.

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

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