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The version 3.3 of FR-Monitor software was released on October 29th, 2015

FR-Monitor, is our user-friendly software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.3. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • Improved GUI fro easier operation
  • Calculation in units other than nanometers.
  • Updated colour analysis method
  • Extended Materials Database both in terms of materials and optical properties models
FR-Monitor v3.2 Release

 

FR-Monitor v3.3 is available for download for both 32- and 64-bit operating systems to all our customers.

FR-Monitor run in all computers with Windows XP, 7, 8, 10

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

The version 3.2 of FR-Monitor software was released on September 1st, 2015

FR-Monitor, is our user-friendly software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.2. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • Option of linked layers per category in case of multilayers of repeating films.
  • Updated colour analysis method
  • Extended Materials Database both in terms of materials and optical properties models
FR-Monitor v3.2 Release

 

FR-Monitor v3.2 is available for download for both 32- and 64-bit operating systems to all our customers.

FR-Monitor run in all computers with Windows XP, 7, 8, 10

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

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The version 3.1 of FR-Monitor software was released on January 2nd, 2015

FR-Monitor, is our software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v3.1. In this version, certain new features and improvements were added, a small fraction of which are:

 

  • Calibration with spectralon
  • Updated GUI
  • Updated Referencing method
  • Extended Materials Database both in terms of materials and optical properties models
  • Updated Color coding
FR-Monitor v2.0 Release

 

FR-Monitor v3.1 is available for download for both 32- and 64-bit operating systems to all our customers.

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

The version 2.5 of FR-Monitor software was released on January 2nd, 2014

FR-Monitor, is our software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor was considerably upgraded and reached v2.5. In this version, certain new features and improvements were added, a small number of a small fraction of which are:

 

  • The TRUST fitting algorithm was added
  • The Lorenz model for the calculation of refractive index of thin and thick layers
  • Updated Referencing method
  • Extended Materials Database both in terms of materials and optical properties models
  • New Color coding for the various graphs
FR-Monitor v2.0 Release

 

FR-Monitor v2.5 is available for download for both 32- and 64-bit operating systems to all our customers.

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

ThetaMetrisis participates in the 3rd NANOTEXNOLOGY Expo 2013, at Thessaloniki Greece, 09-12 July 2013


At the exhibition FR-tools will be demonstrated and characterization of samples will be carried out for conference participants

 
ThetaMetrisis introduce the FR-pOrtable tool: the USB-powered tool for accurate film characterization at the Point of Need at unbeatable price


Thanks to its unique design, FR-pOrtable is the only really portable and handheld spectroscopic reflectance tool in the market. FR-pOrtable integrates a radically designed hybrid light source, combining LED’s and incandescent bulb, which covers the 360nm – 1050nm spectral range and has very long-time & stable optical power. With FR-pOrtable the user can characterize any film or stack of films in the 25nm to 90μm thickness range, either in the lab environment or at the field becoming a truly Point of Need (PoN) tool.

Some of its unique features are:
- Small size, saving expensive lab space
- Really portable and handheld.
- No need for power supply. It draw power from the USB connection to the PC
- Low weight (600gr without the stage)
- Transmission & Absorption measurements (option)
- Large sample stage (up to 15x15cm samples)
- Adjustable distance between the sample and the probe. Thick samples can be accommodated.
- Two years of warranty
- Unbeatable price

 
The version 2.1 of FR-Monitor software was released on June 7th, 2013

FR-Monitor, is our software for the control of all modules in FR-tool series and for the measurement of thickness(es) and optical properties of film stacks. FR-Monitor has reached v2.1 and include a significant number of improvements a small fraction of which are:

 

  • New model for the optical properties of layers is added
  • New fitting algorithm is added
  • Extended Materials Database
FR-Monitor v2.0 Release

 

FR-Monitor v2.1 is available for download for both 32- and 64-bit operating systems to all our customers.

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

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