The versions 2.0 of FR-Monitor software was released on February 15th, 2013

FR-Monitor, our software for the control of FR-tools and the measurement of thickness(es) and optical properties of film stacks has reached version 2.0. This version offers a great number of advantages a small fraction of which are:


  • CPU time needed for fitting has been reduced by almost an order of magnitude
  • The procedure for acquiring reference spectra has been modified and the possibility to use aluminum and silicon substrates has been added
  • New models for the measurement of ultra thick films were added
  • Navigation in the layer stack at a more user friendly way
  • 32-bit and 64-bit Windows operating Systems are both supported
  • Extended Materials Database New format (ex2) substitutes the exp format of former FR-Monitor versions.
FR-Monitor v2.0 Release

For more information please contact the technical support at: This email address is being protected from spambots. You need JavaScript enabled to view it.


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