"I would have no hesitation in recommending ThetaMetrisis tools. I am using a PM-QE tool along with an FR-Basic for the characterization of thin films for photovoltaic tandem cells. Moreover, the tool gives me the opportunity to characterize thin film layers (from ZnO to a-Si) on various substrates. The tool was easily installed and the performance is exceptional. The technical support is always available and reactive to respond to any of our enquiries."
Dr. F. Farmakis, Dept Electrical and Computer Eng. University of Thrace, Greece, September 2012