Description

FR-Education is a low-cost table-top optical instrument for typical optical meauserments (Absorbance/Transmittance, Reflectance, Fluorescence) and non destructive meauserments of Film thickness and optical properties (n & k) of thin and thick films. The measurements of film thickness and optical properties is based on White Light Reflectance Spectroscopy (WLRS). In WLRS, the interference signal, at the VIS/NIR spectrum, from the reflectance of the top and bottom surfaces of the film(s) is collected with the embedded spectrometer and then fitted with the multi-layer reflectance equation to derive the thickness and optical constants of film(s).

FR-Education tool is controlled through especially developed Windows™ software, (FR-Monitor) performing the sptral data acquisition for film thickness and optical constants calculations. A material database is included and can be easily expanded by the user. The entire system (hardware – software): light source, spectrometer, reflectance probe optical fiber, sample stage, and Windows™ software is shipped ready for measurements. The only additional part needed is a PC with a free USB port. The system can be easily used by anyone with basic computer skills without any deep knowledge of optics.

The FR-Education tool can handle layer stacks consisted of numerous layers and two quantities can be calculated simultaneously e.g. thicknesses of two films, thickness and n & k of one film.